Place of Origin: | Japan |
Brand Name: | Tamagawa |
Certification: | CE |
Model Number: | TS2650N11E78 |
Minimum Order Quantity: | 1pcs |
---|---|
Packaging Details: | carton |
Delivery Time: | in stock |
Payment Terms: | T/T, Western Union, MoneyGram |
Supply Ability: | 100pcs/week |
TAMAGAWA: | TAMAGAWA | TS2650N11E78: | TS2650N11E78 |
---|---|---|---|
Japan: | Japan | Color: | Black |
Material: | Iron | Temperature: | 20-90 |
Dimension: | 70mm | Wire: | Wire |
TS2650N11E78
igh-speed actuators may briefly drop out or be activated during this test. If your process | electrical isolation must be ensured between the outputs of a fail-safe output module and |
does not tolerate this, set the pulse duration on of the light or dark test correspondingly or use | the components carrying a higher voltarally the case for relays and contactors. Particular attention must be paid to this |
ctuators that have sufficient lagIf the actuators switch voltages greater than 24 V DC (for example, 230 V DC), safe | issue for semiconductor switching devicesRefer to the manuals of the fail-safe modules for technical specifications to assist you in |
Guang Zhou Lai Jie Electric Co.,LTD
Please contact with “Tommy” for the price
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selecting sensors and actuators. Readback errors may occur on the F-DQ modules if the fail-safe digital output signals and
fail-safe digital input signals are routed through a single cable.During the bit pattern test of the outputs or the sensor supply of the inputs, the steep
switching edge of the output drivers caused by the coupling capacitance of the line may
result in crosstalk to other non-acti by the coupling capacitance of the line may
result in crosstalk to other non-activated output or input channels. This may then lead to a
response of the readback circuit in these channels. The module detects a croSeparate cables for fail-safe DI modules and fail-safe DQ modules / non-fail-safe DQ
modules● Coupling relay or diodes in the outputs
● Disable the short-circuit test of the sensor supply if safety class requirements allow it.
Cause: magnetic crosstalk
Note that an inductive load connected to the F-DQ -DQ channels can induce coupling of a strong
magnetic field.
Solution:
● Spatially disconnect the inductive loads or shield against the magnetic field.
● Configure the "Max. readback time dark test" to 50 ms o